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Power dissipation has become a major concern in VLSI circuit design with the rapid launch of battery powered applications. In high-performance constructions, the leakage component of power consumption is comparable to the switching component. This percentage increases as the technology scales unless effective leak control techniques are in place. In the case of fault-tolerant applications it is also not necessary to adhere to the exact calculation method. Therefore, an approximate multiplier of 8 x 8 is developed in this article using several proposed techniques to reduce leakage power such as MTCMOS, DUAL-Vt, and LECTOR. All of the above techniques are simulated with a tanning tool using 90 nm technology.
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