Towards a Practical Approach to Cost-Oriented Automation and Smart Metrology in Advanced Fabrication

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Hara Prasad Tripathy, Mr. Saurabh Kumar

Abstract

Thanks to the information age, the manufacturing sector faces very critical problems at present and in the near future. The entire value chain is blown up by new data, network, automation, digital customer interfaces. Creation of nanoscale workpieces requires high-quality integration in line with manufacturing processes and micro-Nano metrological evaluation and assessment. There is a multidisciplinary approach of nanotechnology. Modern metrology of production and its industrial implementation began based on the science, technical and organizational research of E.Abbe, William Taylor and Frederick Winslow Taylor and the development of the "Quality Control Generation" at the end of the twentieth century has entered nanotechnology and is progressing towards pico-and femto-technology. In order to meet potential high-level demands from both industrial and private customers, manufacturing companies must be versatile and agile enough to adapt quickly to changes in product demand, particularly in the field of micro, nano and pico-scale precision engineering. Dynamic cost-effective customer-driven design and production can be realized with the help of AI and dynamic IT.

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